The General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses … Read More
The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe … Read More
The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups, even on insulating samples, with nanometer-scale pattering and sample modification. Learn about this powerful technique available at the LSM facilities and its numerous applications. Part 1: An introduction to Helium Ion Microscopy (~30 min) - Sylvie Rangan … Read More
