Ion Beam Analysis Workshop
Department of Physics and Astronomy Room 330 136 Frelinghuysen Rd, Piscataway, NJ, United StatesThe General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses from the nm- to the μm-scale. ERDA (Elastic Recoil Detection Analysis) is one of the rare methods giving access to hydrogen concentration in materials. NRA … Read More