Canceled Electron spectroscopies workshop
The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe … Read More