BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Laboratory for Surface Modification - ECPv6.7.0//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://lsm.rutgers.edu
X-WR-CALDESC:Events for Laboratory for Surface Modification
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:UTC
BEGIN:STANDARD
TZOFFSETFROM:+0000
TZOFFSETTO:+0000
TZNAME:UTC
DTSTART:20230101T000000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=UTC:20260716T100000
DTEND;TZID=UTC:20260716T110000
DTSTAMP:20260726T154452
CREATED:20260619T192253Z
LAST-MODIFIED:20260715T210309Z
UID:758-1784196000-1784199600@lsm.rutgers.edu
SUMMARY:Electron spectroscopies workshop
DESCRIPTION:The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering\, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles\, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe near-surface elemental and chemical information. UV-photoemission can be used to probe valence states with great details and can provide a measure of surface work functions. Reflected electron energy loss spectroscopy (REELS) is a complementary technique that can access energy band gaps. Thus\, a combination UPS and REELS provides a picture of band edges and vacuum energy levels. Secondary electron yields (SEY) measurements\, a recent addition to our capabilities\, will be discussed as well. All these techniques will be illustrated with recent applications ranging from LED technologies\, to photocatalysis\, photolithography or organic electronics.
URL:https://lsm.rutgers.edu/event/electron-spectroscopies-workshop-2/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/jpeg:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2024/01/XPS_Flyer.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=UTC:20240327T130000
DTEND;TZID=UTC:20240327T140000
DTSTAMP:20260726T154452
CREATED:20240312T190233Z
LAST-MODIFIED:20240312T190233Z
UID:687-1711544400-1711548000@lsm.rutgers.edu
SUMMARY:Helium Ion Microscopy Workshop
DESCRIPTION:The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups\, even on insulating samples\, with nanometer-scale pattering and sample modification. Learn about this powerful technique available at the LSM facilities and its numerous applications. \n  \nPart 1: An introduction to Helium Ion Microscopy (~30 min) – Sylvie Rangan \nPart 2: Practical Applications from Biology to Material Science (~30min) – Leila Kasaei \nPart 3: Demo in NPL (~30min)  (limited to 10 on-site participants) \nJoin Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09
URL:https://lsm.rutgers.edu/event/helium-ion-microscopy-workshop/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/png:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2024/03/HIM_Tinny.png
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=UTC:20240208T110000
DTEND;TZID=UTC:20240208T120000
DTSTAMP:20260726T154452
CREATED:20240112T161145Z
LAST-MODIFIED:20240112T161517Z
UID:673-1707390000-1707393600@lsm.rutgers.edu
SUMMARY:Electron spectroscopies Workshop
DESCRIPTION:The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering\, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles\, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe near-surface elemental and chemical information. UV-photoemission can be used to probe valence states with great details and can provide a measure of surface work functions. Reflected electron energy loss spectroscopy (REELS) is a complementary technique that can access energy band gaps. Thus\, a combination UPS and REELS provides a picture of band edges and vacuum energy levels. Secondary electron yields (SEY) measurements\, a recent addition to our capabilities\, will be discussed as well. All these techniques will be illustrated with recent applications ranging from LED technologies\, to photocatalysis\, photolithography or organic electronics.
URL:https://lsm.rutgers.edu/event/electron-spectroscopies-workshop/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/jpeg:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2024/01/XPS_Flyer.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=UTC:20240111T110000
DTEND;TZID=UTC:20240111T120000
DTSTAMP:20260726T154453
CREATED:20231227T154426Z
LAST-MODIFIED:20231228T161812Z
UID:523-1704970800-1704974400@lsm.rutgers.edu
SUMMARY:Ion Beam Analysis Workshop
DESCRIPTION:The General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses from the nm- to the μm-scale.  ERDA (Elastic Recoil Detection Analysis) is one of the rare methods giving access to hydrogen concentration in materials. NRA (Nuclear Reaction Analysis) encompasses a number of methods to obtain the elemental concentration of light elements\, as well as isotopic information. Finally\, crystalline order and defects can be probed using channeling methods. All these aspects will be introduced and discussed\, followed by a visit of the ion beam facilities. \n  \nPart 1: An introduction to ion beam analsysis (~30 min) – Sylvie Rangan \nPart 2: Practical Applications (~30min) – Hussein Hijazi \nPart 3: Demo in NPL (~30min) (limited to 10 on-site participants) \nJoin Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09
URL:https://lsm.rutgers.edu/event/ion-beam-analysis-workshop/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/jpeg:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2023/12/RBS_WS_small-6.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=UTC:20231110T150000
DTEND;TZID=UTC:20231110T160000
DTSTAMP:20260726T154453
CREATED:20180516T202118Z
LAST-MODIFIED:20250919T130242Z
UID:199-1699628400-1699632000@lsm.rutgers.edu
SUMMARY:Helium Ion Microscopy Workshop
DESCRIPTION:The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups\, even on insulating samples\, with nanometer-scale pattering and sample modification. Learn about this powerful technique available at the LSM facilities and its numerous applications. \n  \nPart 1: An introduction to Helium Ion Microscopy (~30 min) – Sylvie Rangan \nPart 2: Practical Applications from Biology to Material Science (~30min) – Leila Kasaei \nPart 3: Demo in NPL (~30min)  (limited to 10 on-site participants) \nJoin Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09
URL:https://lsm.rutgers.edu/event/stargazing-tour/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
END:VEVENT
END:VCALENDAR