Laboratory for Surface Modification

Helium Ion Microscopy Workshop
2024-03-27 13:00 - 14:00, 2023-11-10 15:00 - 16:00 UTC | Department of Physics and Astronomy Room 330, 136 Frelinghuysen Rd, Piscataway, NJ, 08854, United States
The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups, even on insulating samples, with nanometer-scale pattering and sample modification. Learn about this powerful technique available at the LSM facilities and its numerous applications.

Part 1: An introduction to Helium Ion Microscopy (~30 min) – Sylvie Rangan
Part 2: Practical Applications from Biology to Material Science (~30min) – Leila Kasaei
Part 3: Demo in NPL (~30min) (limited to 10 on-site participants)
Join Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=[REDACTED]

Electron spectroscopies Workshop
2024-02-08 11:00 - 12:00
The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe near-surface elemental and chemical information. UV-photoemission can be used to probe valence states with great details and can provide a measure of surface work functions. Reflected electron energy loss spectroscopy (REELS) is a complementary technique that can access energy band gaps. Thus, a combination UPS and REELS provides a picture of band edges and vacuum energy levels. Secondary electron yields (SEY) measurements, a recent addition to our capabilities, will be discussed as well. All these techniques will be illustrated with recent applications ranging from LED technologies, to photocatalysis, photolithography or organic electronics.

Ion Beam Analysis Workshop
2024-01-11 11:00 - 12:00
The General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses from the nm- to the μm-scale. ERDA (Elastic Recoil Detection Analysis) is one of the rare methods giving access to hydrogen concentration in materials. NRA (Nuclear Reaction Analysis) encompasses a number of methods to obtain the elemental concentration of light elements, as well as isotopic information. Finally, crystalline order and defects can be probed using channeling methods. All these aspects will be introduced and discussed, followed by a visit of the ion beam facilities.

Part 1: An introduction to ion beam analsysis (~30 min) – Sylvie Rangan
Part 2: Practical Applications (~30min) – Hussein Hijazi
Part 3: Demo in NPL (~30min) (limited to 10 on-site participants)
Join Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=[REDACTED]
