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PRODID:-//Laboratory for Surface Modification - ECPv6.7.0//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:Laboratory for Surface Modification
X-ORIGINAL-URL:https://lsm.rutgers.edu
X-WR-CALDESC:Events for Laboratory for Surface Modification
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:UTC
BEGIN:STANDARD
TZOFFSETFROM:+0000
TZOFFSETTO:+0000
TZNAME:UTC
DTSTART:20230101T000000
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END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=UTC:20240111T110000
DTEND;TZID=UTC:20240111T120000
DTSTAMP:20261003T083141
CREATED:20231227T154426Z
LAST-MODIFIED:20231228T161812Z
UID:523-1704970800-1704974400@lsm.rutgers.edu
SUMMARY:Ion Beam Analysis Workshop
DESCRIPTION:The General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses from the nm- to the μm-scale.  ERDA (Elastic Recoil Detection Analysis) is one of the rare methods giving access to hydrogen concentration in materials. NRA (Nuclear Reaction Analysis) encompasses a number of methods to obtain the elemental concentration of light elements\, as well as isotopic information. Finally\, crystalline order and defects can be probed using channeling methods. All these aspects will be introduced and discussed\, followed by a visit of the ion beam facilities. \n  \nPart 1: An introduction to ion beam analsysis (~30 min) – Sylvie Rangan \nPart 2: Practical Applications (~30min) – Hussein Hijazi \nPart 3: Demo in NPL (~30min) (limited to 10 on-site participants) \nJoin Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09
URL:https://lsm.rutgers.edu/event/ion-beam-analysis-workshop/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/jpeg:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2023/12/RBS_WS_small-6.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=UTC:20231110T150000
DTEND;TZID=UTC:20231110T160000
DTSTAMP:20261003T083141
CREATED:20180516T202118Z
LAST-MODIFIED:20250919T130242Z
UID:199-1699628400-1699632000@lsm.rutgers.edu
SUMMARY:Helium Ion Microscopy Workshop
DESCRIPTION:The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups\, even on insulating samples\, with nanometer-scale pattering and sample modification. Learn about this powerful technique available at the LSM facilities and its numerous applications. \n  \nPart 1: An introduction to Helium Ion Microscopy (~30 min) – Sylvie Rangan \nPart 2: Practical Applications from Biology to Material Science (~30min) – Leila Kasaei \nPart 3: Demo in NPL (~30min)  (limited to 10 on-site participants) \nJoin Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09
URL:https://lsm.rutgers.edu/event/stargazing-tour/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
END:VEVENT
END:VCALENDAR