The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups, even on insulating samples, with nanometer-scale pattering and sample modification. Learn about this … Read More
The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe … Read More
The General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses from the nm- to the μm-scale. ERDA (Elastic Recoil Detection Analysis) is one of the rare methods giving access to hydrogen concentration in materials. NRA … Read More
