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X-ORIGINAL-URL:https://lsm.rutgers.edu
X-WR-CALDESC:Events for Laboratory for Surface Modification
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DTSTART:20240101T000000
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DTSTART;TZID=UTC:20240208T110000
DTEND;TZID=UTC:20240208T120000
DTSTAMP:20260421T031248
CREATED:20240112T161145Z
LAST-MODIFIED:20240112T161517Z
UID:673-1707390000-1707393600@lsm.rutgers.edu
SUMMARY:Electron spectroscopies Workshop
DESCRIPTION:The workshop will cover several electron spectroscopy methods available in the LSM XPS facilities. X-ray photoemission spectroscopy (XPS) is a powerful technique allowing elemental and chemical analysis of surfaces. Coupled to sputtering\, XPS can measure elemental depth profiles across materials. For non-destructive depth profiles\, angle-resolved x-ray photoemission spectroscopy (ARXPS) is an alternative method to probe near-surface elemental and chemical information. UV-photoemission can be used to probe valence states with great details and can provide a measure of surface work functions. Reflected electron energy loss spectroscopy (REELS) is a complementary technique that can access energy band gaps. Thus\, a combination UPS and REELS provides a picture of band edges and vacuum energy levels. Secondary electron yields (SEY) measurements\, a recent addition to our capabilities\, will be discussed as well. All these techniques will be illustrated with recent applications ranging from LED technologies\, to photocatalysis\, photolithography or organic electronics.
URL:https://lsm.rutgers.edu/event/electron-spectroscopies-workshop/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/jpeg:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2024/01/XPS_Flyer.jpg
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