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X-ORIGINAL-URL:https://lsm.rutgers.edu
X-WR-CALDESC:Events for Laboratory for Surface Modification
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DTSTART:20240101T000000
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BEGIN:VEVENT
DTSTART;TZID=UTC:20240111T110000
DTEND;TZID=UTC:20240111T120000
DTSTAMP:20260420T064356
CREATED:20231227T154426Z
LAST-MODIFIED:20231228T161812Z
UID:523-1704970800-1704974400@lsm.rutgers.edu
SUMMARY:Ion Beam Analysis Workshop
DESCRIPTION:The General Ionex Tandetron gives access to a wide range of thin film and bulk samples analysis. RBS (Rutherford Back Scattering) measures not only elemental composition but also film thicknesses from the nm- to the μm-scale.  ERDA (Elastic Recoil Detection Analysis) is one of the rare methods giving access to hydrogen concentration in materials. NRA (Nuclear Reaction Analysis) encompasses a number of methods to obtain the elemental concentration of light elements\, as well as isotopic information. Finally\, crystalline order and defects can be probed using channeling methods. All these aspects will be introduced and discussed\, followed by a visit of the ion beam facilities. \n  \nPart 1: An introduction to ion beam analsysis (~30 min) – Sylvie Rangan \nPart 2: Practical Applications (~30min) – Hussein Hijazi \nPart 3: Demo in NPL (~30min) (limited to 10 on-site participants) \nJoin Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09
URL:https://lsm.rutgers.edu/event/ion-beam-analysis-workshop/
LOCATION:Department of Physics and Astronomy Room 330\, 136 Frelinghuysen Rd\, Piscataway\, NJ\, 08854\, United States
CATEGORIES:Workshop
ATTACH;FMTTYPE=image/jpeg:https://sites.rutgers.edu/surface-modification/wp-content/uploads/sites/1136/2023/12/RBS_WS_small-6.jpg
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