Helium Ion Microscopy Workshop

The Zeiss Orion Plus Helium Ion Microscope combines the advantages of the best secondary electron imaging setups, even on insulating samples, with nanometer-scale pattering and sample modification. Learn about this powerful technique available at the LSM facilities and its numerous applications.

Part 1: An introduction to Helium Ion Microscopy (~30 min) – Sylvie Rangan

Part 2: Practical Applications from Biology to Material Science (~30min) – Leila Kasaei

Part 3: Demo in NPL (~30min)  (limited to 10 on-site participants)

Join Zoom Meeting at: https://rutgers.zoom.us/j/94435281331?pwd=cXRXeWhySFJOb3ZnZGFnSFdRQkR2QT09