AES - Auger electron spectroscopy
	Introduction
	Physical basis
	Another explanation
	Theory
	AFM - Atomic Force Microscopy
	EELS - Electron Energy Loss Spectroscopy
	Tutorial
	Theory of vibrational spectroscopy
	ELS-LEED - Energy Loss Spectroscopy of Low-Energy Electron  Diffraction
	ESCA - Electron Spectroscopy for Chemical Analysis
	ESD - Electron stimulated desorption
	ESDIAD - Electron stimulated desorption ion angular distribution
	Temperature-programmed ESDIAD/TOF system
	Electron Induced Reactions
	HREELS - High-Resolution Electron Energy Loss Spectroscopy
	IFCM - Ion-fluorescence coincidence measurements
	IR Spectroscopy
	LEED - Low energy electron diffraction
	Introduction
	Physical basis
	How does it work?
	Instruments
	Simple presentation
	MS - Mass Spectrometry
	PEEM - Photoemission electron microscopy
	PED - Photoelectron diffraction
	PES - Photoelectron spectroscopy
	SANS - Small Angle Neutron Scattering Instrument
	SEI - Secondary electron imaging
	SIMS - Secondary Ion Mass Spectroscopy
	Short descripton of TOF-SIMS
	Theory
	STM - Scanning Tunneling Microscopy
	Tutorial
	Description (in German)
	STM Spectroscopy (in German)
	TPD - Temperature Programmed Desorption
	Description
	Theory and techniques
	Simulation (program in Excel)
	Theory
	TPRS - Temperature Programmed Reaction Spectroscopy
	UPS - Ultraviolet Photoelectron Spectroscopy
	XPS -  X-ray Photoelectron Spectroscopy
	Introduction
	Physical basis
	XRD - X-ray diffraction
	Reviews:
	Surface Analytical Techniques
	Short description of several difraction and spectroscopy techniques (in Russian)